[Stoppi] has taken on a fascinating project involving the interference of thin layers, a phenomenon often observed in everyday life but rarely explored in such depth. This project delves into the ...

Diagram of an X-ray Reflectometry (XRR) setup: This schematic shows the arrangement of the X-ray tube, Gӧbel mirror, sample holder, and detector. The X-rays are emitted from the tube, shaped by slits ...

insights from industryDr. Max Junda & Dr. Lyle GordonSenior Member of the Technical Staff and Director of MaterialsCovalent Metrology In this interview, AZoMaterials speaks with Dr. Max Junda, Senior ...

Ellipsometry is a non-destructive, optical measurement technique that characterizes the optical properties of thin films. It is highly sensitive to changes in the thickness and refractive index of the ...