General discussion in the metrology field tends to revolve around the relative merits of non-contact or contact measurement solutions. However, demand now exists in almost every industry for more ...

NVT has recently developed the fastest, most advanced and most versatile laser singulation and metrology tools in the ...

Within the semiconductor industry, there is a continual demand for integrated circuits (IC) that exhibit higher performance at a lower cost than its predecessors. Wafer metrology tools are used to ...

Engineers leverage both device-specific and tool-level data to identify a process “sweet spot.” Tight, frequent tool-to-tool matching enables greater yield and fab flexibility. Machine learning helps ...

In an effort to cut expenses, semiconductor manufacturers have minimized metrology and inspection tool purchases this year, according to New Tripoli, Pa.-based market researchers at The Information ...

This guide offers insight into 3D metrology by looking at how 3D metrology works and when to use 3D metrology. BAXTER, Minn., Jan. 15, 2025 /PRNewswire-PRWeb/ -- Metrology Parts has announced the ...

Techniques are evolving using multiple existing tools, with more technologies in research, but the ultimate solution may be a hybrid approach. In the previous decade, chipmakers made a bold but ...

As continued progress of Moore’s Law approaches the next two semiconductor technology nodes, 11 nanometers and 7 nanometers, new metrology instruments — a kind of fine-scaled ruler — is needed to ...

ALBANY, New York & MADISON, Wis.--(BUSINESS WIRE)--Bruker AXS, the market leader in X-Ray Diffraction (XRD) instrumentation, is pleased to announce that SEMATECH, the global consortium of ...

Although thin-film and crystalline-silicon PV (photovoltaic) solar wafers and cells share some similar defects, they require different manufacturing and inspection techniques. Crystalline-silicon ...