A scanning electron microscope, acquired in 2016 with a grant from the National Science Foundation, provides a powerful tool for students, faculty, and visiting researchers to study the structure and ...

Revolutionizing material analysis, ESEM examines challenging samples under natural conditions, enhancing research in ...

Among all the instruments in its class, the Thermo Scientific Prisma E Scanning Electron Microscope (SEM) offers the most comprehensive solution, thanks to its sophisticated automation and extensive ...

According to [Asianometry], no one believed in the scanning electron microscope. No one, that is, except [Charles Oatley].The video below tells the whole story. The Cambridge graduate built radios ...

Scanning Electron Microscopy (SEM) remains an indispensable tool for visualising material surfaces at the nanometre scale. The technique relies on a focused electron beam to generate high-resolution ...

TOKYO--(BUSINESS WIRE)--JEOL Ltd. (TOKYO:6951)(President & COO Izumi Oi) announces the development and release of a new scanning electron microscope (SEM), the JSM-IT510 series, in November 2021.

Environmental Scanning Electron Microscopy (ESEM) represents a significant evolution of conventional scanning electron microscopy. By utilising variable pressure conditions rather than the high vacuum ...

TOKYO--(BUSINESS WIRE)--JEOL Ltd. (TOKYO:6951) (President & COO Izumi Oi) announced that it has developed semi-in-lens versions (i)/(is) which are optimal for the observation of semiconductor devices ...

Attending the RAISe+ Scheme Signing Ceremony are Professor Chen Fu-Rong (2nd left) and his research team members: Professor Hsueh Yu-Chun (1st left), Dr Chen Yan (2nd right) and Mr Chen Yuchi (1st ...

Using a STEM-in-SEM conversion holder, we can convert a scanning electron microscope into a scanning transmission microscope. Neat!

Some of you probably know this already, but there’s actually more than one kind of electron microscope. In electronics work, the scanning electron microscope (SEM) is the most common. You hit ...

A new technical paper titled “Scanning electron microscopy-based automatic defect inspection for semiconductor manufacturing: a systematic review” was published by researchers at KU Leuven and imec.