The research 'Impact of Contact Gating on Scaling of Monolayer 2D Transistors Using a Symmetric Dual-Gate Structure' appeared ...

Researchers at Cornell University have developed a powerful imaging technique that reveals atomic scale defects inside computer chips for the first time. Using an advanced electron microscopy method, ...

Duke engineers show how a common device architecture used to test 2D transistors overstates their performance prospects in real-world devices.

A stunning new imaging breakthrough lets scientists see — and fix — the atomic flaws hiding inside tomorrow’s computer chips.

(Nanowerk News) Silicon’s crown is under threat: The semiconductor’s days as the king of microchips for computers and smart devices could be numbered, thanks to the development of the smallest ...

In a paper published in the journal Nature Electronics, researchers from EPFL’s School of Engineering in the Laboratory of Nanoscale Electronics and Structures (LANES) present a new processor that ...

For almost two decades, scientists have been trying to move beyond silicon, the material ...

Cornell researchers have used high-resolution 3D imaging to detect, for the first time, the atomic-scale defects in computer chips that can sabotage their performance. The imaging method, which was ...

After memory products like NAND Flash and DRAM, it's reported that Samsung Electronics will conduct R&D for a "3D stacking" technology that can vertically stack system semiconductor transistors.

CAMBRIDGE, Mass. -- Silicon's crown is under threat: The semiconductor's days as the king of microchips for computers and smart devices could be numbered, thanks to the development of the smallest ...