EDN

Electroglas rolls out test handler for wafer-level packages, known-good die

MUNICH — Electroglas Inc. today at the Semicon Europa trade show here introduced a new test-handling solution for devices in wafer-level packages, unpackaged known-good die products, thin wafers, ...
Semiconductor Engineering

Singulated Die Test Ensures Stacked Die Quality As Power Density Rises

The high power density in turn produces large thermal gradients, with the low to max temperature changes increasing ...
EDN

TEL debuts handler for wafer-level packages, KGD

TOKYO–Japan's Tokyo Electron Ltd. (TEL) announced Monday (April 12) that it will begin sales of a test handler that supports wafer-level packages and known-good die (KGD) products. Current process ...
Yahoo Finance

RoodMicrotec and AEM announce strategic cooperation in the Central European market

This equipment is also set up for 200 mm wafer frame probing of a wide range of semiconductor devices. As a pioneer in developing and deploying application-specific test solutions for MEMS devices, ...
Nasdaq

Major Silicon Carbide Semiconductor Supplier Chooses Aehr for Production Wafer Level Test and Burn-in with Initial FOX-XP and Integrated Automated WaferPak Aligner Order

FREMONT, Calif., Dec. 07, 2022 (GLOBE NEWSWIRE) -- Aehr Test Systems (NASDAQ: AEHR), a worldwide supplier of semiconductor production test and reliability qualification equipment, today announced it ...
Business Wire

Electroglas' Sidewinder Strip Test Handler Named Best New Product for Handling Equipment by Advanced Packaging; Annual Award Honors Advancement in Semiconductor Packaging ...

SAN JOSE, Calif.--(BUSINESS WIRE)--July 15, 2004--Electroglas, Inc. (Nasdaq:EGLS), a leading supplier of wafer probing and test handling solutions for the semiconductor industry, today announced that ...
Nasdaq

Aehr to Showcase FOX-P™ Wafer-Level, Die and Module Test Solutions at Virtual SWTest Untethered 2020 Conference on November 11

FREMONT, Calif., Nov. 09, 2020 (GLOBE NEWSWIRE) -- Aehr Test Systems (NASDAQ: AEHR), a worldwide supplier of semiconductor test and reliability qualification equipment, will be showcasing its FOX-P™ ...
ksn.com

Aehr Receives Order from New Customer for FOX-NP™ Multi-Wafer Test and Burn-in System for Silicon Carbide MOSFETs

FREMONT, Calif., Sept. 18, 2023 (GLOBE NEWSWIRE) -- Aehr Test Systems (NASDAQ: AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced it has received an initial ...
Seeking Alpha

Aehr Announces New Advanced Testing Capabilities on its FOX-P™ Wafer Level Test & Burn-in Systems for Silicon Carbide and Gallium Nitride Technologies

FREMONT, Calif., Oct. 06, 2022 (GLOBE NEWSWIRE) -- Aehr Test Systems (AEHR), a worldwide supplier of semiconductor test and reliability qualification equipment, today announced it has released two new ...
Seeking Alpha

Aehr Test Systems and ISE Labs Announce Partnership on Wafer-Level Test and Burn-in for High-Performance Computing and Artificial Intelligence Processors

FREMONT, CA / ACCESS Newswire / November 3, 2025 / Aehr Test Systems (AEHR), a worldwide supplier of semiconductor test and burn-in solutions, today announced a strategic partnership with ISE Labs, ...
Semiconductor Engineering

Geo-Spatial Outlier Detection

Comparing die test results with other die on a wafer helps identify outliers, but combining that data with the exact location of an outlier offers a much deeper understanding of what can go wrong and ...